Publication:
Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
Loading...
Journal
Abstract
Description
Statistics
Downloads
229 since deposited on 2023-10-05
14last month
1last week
Acq. date: 2026-01-27
Views
859 since deposited on 2023-10-05
Acq. date: 2026-01-27
Citations
Statistics
Downloads
229 since deposited on 2023-10-05
14last month
1last week
Acq. date: 2026-01-27
Views
859 since deposited on 2023-10-05
Acq. date: 2026-01-27
Citations