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Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques
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Acq. date: 2026-03-16
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247 since deposited on 2023-10-05
13last month
5last week
Acq. date: 2026-03-16
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859 since deposited on 2023-10-05
Acq. date: 2026-03-16
Citations