| dc.contributor.author | Hubrechtsen, Liese | |
| dc.contributor.author | De Taeye, Louis | |
| dc.contributor.author | Vereecken, Philippe | |
| dc.date.accessioned | 2024-02-26T15:40:10Z | |
| dc.date.available | 2023-10-22T17:23:00Z | |
| dc.date.available | 2024-02-26T15:40:10Z | |
| dc.date.issued | 2024 | |
| dc.identifier.issn | 2366-9608 | |
| dc.identifier.other | WOS:001076322900001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42902.2 | |
| dc.source | WOS | |
| dc.title | Tracking Decomposition Layer Formation in Thin-Film Si Electrodes via Thermogalvanic Profiles | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Hubrechtsen, Liese | |
| dc.contributor.imecauthor | De Taeye, Louis | |
| dc.contributor.imecauthor | Vereecken, Philippe | |
| dc.contributor.orcidimec | Hubrechtsen, Liese::0000-0003-4546-2316 | |
| dc.contributor.orcidimec | De Taeye, Louis::0000-0002-9891-0007 | |
| dc.contributor.orcidimec | Vereecken, Philippe::0000-0003-4115-0075 | |
| dc.identifier.doi | 10.1002/smtd.202300857 | |
| dc.source.numberofpages | 17 | |
| dc.source.peerreview | yes | |
| dc.source.beginpage | Art. 2300857 | |
| dc.source.endpage | N/A | |
| dc.source.journal | SMALL METHODS | |
| dc.identifier.pmid | MEDLINE:37800995 | |
| dc.source.issue | 1 | |
| dc.source.volume | 8 | |
| imec.availability | Published - imec | |
| dc.description.wosFundingText | The authors would like to thank the imec SEM team for scheduling and executing the SEM measurements in this work. Additionally, the authors thank the following people for executing and analyzing the physical measurements: Johan Desmet for RBS, Praveen Dara and Johan Meersschaut for ERD, Thomas Nuytten and Stefanie Sergeant for Raman, and Alexis Franquet and Valentina Spampinato for ToF-SIMS. This project has received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation program (HARVESTORE, FET-RIA-824072). | |
