dc.contributor.author | Evans, Sarah R. | |
dc.contributor.author | Deylgat, Emeric | |
dc.contributor.author | Chen, Edward | |
dc.contributor.author | Vandenberghe, William G. | |
dc.date.accessioned | 2024-02-29T16:05:15Z | |
dc.date.available | 2023-11-10T17:29:48Z | |
dc.date.available | 2024-02-29T16:05:15Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2331-7019 | |
dc.identifier.other | WOS:001088984700002 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43125.2 | |
dc.source | WOS | |
dc.title | Image-force barrier lowering of Schottky barriers in two-dimensional materials as a function of metal contact angle | |
dc.type | Journal article | |
dc.contributor.imecauthor | Deylgat, Emeric | |
dc.identifier.doi | 10.1103/PhysRevApplied.20.044003 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 044003 | |
dc.source.endpage | N/A | |
dc.source.journal | PHYSICAL REVIEW APPLIED | |
dc.source.issue | 4 | |
dc.source.volume | 23 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This material is based upon work supported by the Taiwan Semiconductor Manufacturing Company, Ltd. | |