dc.contributor.author | Neumann, Jens Timo | |
dc.contributor.author | Srikantha, Abhilash | |
dc.contributor.author | Huethwohl, Philipp | |
dc.contributor.author | Lee, Keumsil | |
dc.contributor.author | William, B. James | |
dc.contributor.author | Korb, Thomas | |
dc.contributor.author | Foca, Eugen | |
dc.contributor.author | Garbowski, Tomasz | |
dc.contributor.author | Boecker, Daniel | |
dc.contributor.author | Das, Sayantan | |
dc.contributor.author | Halder, Sandip | |
dc.date.accessioned | 2024-03-04T13:19:48Z | |
dc.date.available | 2024-01-08T17:19:01Z | |
dc.date.available | 2024-03-04T13:19:48Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1932-5150 | |
dc.identifier.other | WOS:001122014400007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43359.2 | |
dc.source | WOS | |
dc.title | Defect detection and classification on imec iN5 node BEoL test vehicle with multibeam scanning electron microscope | |
dc.type | Journal article | |
dc.contributor.imecauthor | Das, Sayantan | |
dc.contributor.imecauthor | Halder, Sandip | |
dc.contributor.orcidimec | Das, Sayantan::0000-0002-3031-0726 | |
dc.contributor.orcidimec | Halder, Sandip::0000-0002-6314-2685 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1117/1.JMM.22.2.021009 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 021009 | |
dc.source.endpage | N/A | |
dc.source.journal | JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 | |
dc.source.issue | 2 | |
dc.source.volume | 22 | |
imec.availability | Published - imec | |