dc.contributor.author | Deylgat, Emeric | |
dc.contributor.author | Chen, Edward | |
dc.contributor.author | Soree, Bart | |
dc.contributor.author | Vandenberghe, William G. | |
dc.date.accessioned | 2024-03-21T10:45:36Z | |
dc.date.available | 2024-01-11T17:16:16Z | |
dc.date.available | 2024-03-21T10:45:36Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1946-1569 | |
dc.identifier.other | WOS:001117703800012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43379.2 | |
dc.source | WOS | |
dc.title | Quantum Transport Study of Contact Resistance of Edge- and Top-Contacted Two-Dimensional Materials | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Deylgat, Emeric | |
dc.contributor.imecauthor | Soree, Bart | |
dc.contributor.orcidimec | Soree, Bart::0000-0002-4157-1956 | |
dc.identifier.eisbn | 978-4-86348-803-8 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 45 | |
dc.source.endpage | 48 | |
dc.source.conference | International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) | |
dc.source.conferencedate | SEP 27-29, 2023 | |
dc.source.conferencelocation | Kobe | |
dc.source.journal | N/A | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This work has been supported by the Taiwan Semiconductor Manufacturing Company, Ltd. | |