dc.contributor.author | Aouichi, Ahmed | |
dc.contributor.author | Yuan, Sicong | |
dc.contributor.author | Fieback, Moritz | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Kim, Woojin | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Couet, Sebastien | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2024-03-21T13:56:08Z | |
dc.date.available | 2024-01-22T17:51:06Z | |
dc.date.available | 2024-03-21T13:56:08Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1081-7735 | |
dc.identifier.other | WOS:001108557200013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43441.2 | |
dc.source | WOS | |
dc.title | Device Aware Diagnosis for Unique Defects in STT-MRAMs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Kim, Woojin | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Couet, Sebastien | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Kim, Woojin::0000-0002-2755-6661 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.contributor.orcidimec | Couet, Sebastien::0000-0001-6436-9593 | |
dc.identifier.doi | 10.1109/ATS59501.2023.10317952 | |
dc.identifier.eisbn | 979-8-3503-0310-0 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 71 | |
dc.source.endpage | 76 | |
dc.source.conference | 32nd IEEE Asian Test Symposium (ATS) | |
dc.source.conferencedate | OCT 14-17, 2023 | |
dc.source.conferencelocation | Beijing | |
dc.source.journal | N/A | |
imec.availability | Published - imec | |
dc.description.wosFundingText | This work is supported by IMEC's Industrial Affiliation Program on STT-MRAM devices. | |