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dc.contributor.authorPaeps, Filip
dc.contributor.authorDegreef, Thomas
dc.contributor.authorDuthoo, Wout
dc.contributor.authorKoumans, Yorick
dc.contributor.authorEmmen, Erik
dc.contributor.authorYurt, Abdulkadir
dc.contributor.authorMarchal, Elisabeth
dc.contributor.authorKossarev, Andrey
dc.contributor.authorDam, Tho
dc.contributor.authorHanifa, Rabea
dc.contributor.authorVan Duppen, Joost
dc.contributor.authorLuo, Zhenxiang
dc.contributor.authorPeca, Marco
dc.contributor.authorWauters, Tobe
dc.contributor.authorVleugels, Wouter
dc.contributor.authorChakrova, Nadia
dc.contributor.authorBerte, Johan
dc.contributor.authorVernieuwe, Floris
dc.contributor.authorDelgrange, Maxime
dc.contributor.authorPrasanth, Hari
dc.contributor.authorVan Geyt, Sven
dc.contributor.authorMortier, Frederik
dc.contributor.authorRaymenants, Joren
dc.contributor.authorAndre, Emmanuel
dc.contributor.authorVan den Wijngaert, Nik
dc.contributor.authorPeumans, Peter
dc.contributor.authorStakenborg, Tim
dc.contributor.authorVerbruggen, Bert
dc.date.accessioned2024-01-23T10:47:11Z
dc.date.available2024-01-23T10:47:11Z
dc.date.issued2023
dc.identifier.issn2590-0072
dc.identifier.otherWOS:001092080400001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43442
dc.sourceWOS
dc.titleDevelopment of an integrated breath analysis technology for on-chip aerosol capture and molecular analysis
dc.typeJournal article
dc.contributor.imecauthorPaeps, Filip
dc.contributor.imecauthorDuthoo, Wout
dc.contributor.imecauthorEmmen, Erik
dc.contributor.imecauthorYurt, Abdulkadir
dc.contributor.imecauthorMarchal, Elisabeth
dc.contributor.imecauthorKossarev, Andrey
dc.contributor.imecauthorHanifa, Rabea
dc.contributor.imecauthorVan Duppen, Joost
dc.contributor.imecauthorLuo, Zhenxiang
dc.contributor.imecauthorPeca, Marco
dc.contributor.imecauthorVan den Wijngaert, Nik
dc.contributor.imecauthorPeumans, Peter
dc.contributor.imecauthorStakenborg, Tim
dc.contributor.imecauthorVerbruggen, Bert
dc.contributor.imecauthorDam, Tho
dc.contributor.orcidextAndre, Emmanuel::0000-0001-8321-3770
dc.contributor.orcidimecMarchal, Elisabeth::0000-0003-1310-4792
dc.contributor.orcidimecPaeps, Filip::0000-0002-9710-2892
dc.contributor.orcidimecDuthoo, Wout::0000-0003-2975-9718
dc.contributor.orcidimecYurt, Abdulkadir::0000-0002-1413-6756
dc.contributor.orcidimecKossarev, Andrey::0000-0003-2696-3705
dc.contributor.orcidimecHanifa, Rabea::0009-0001-9621-3558
dc.contributor.orcidimecVan Duppen, Joost::0000-0001-5420-8542
dc.contributor.orcidimecLuo, Zhenxiang::0000-0001-7818-4004
dc.contributor.orcidimecStakenborg, Tim::0000-0001-9878-9078
dc.contributor.orcidimecVerbruggen, Bert::0000-0002-0772-7937
dc.date.embargo2023-12-31
dc.identifier.doi10.1016/j.mne.2023.100228
dc.source.numberofpages9
dc.source.peerreviewyes
dc.source.beginpageArt. 100228
dc.source.endpageN/A
dc.source.journalMICRO AND NANO ENGINEERING
dc.source.issueN/A
dc.source.volume21
imec.availabilityPublished - open access


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