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Evidence of Heat-Assisted Atomic Migration in GeSe Self-Selecting Memory at High Operating Current Density

dc.contributor.authorRavsher, Taras
dc.contributor.authorGarbin, Daniele
dc.contributor.authorFantini, Andrea
dc.contributor.authorDegraeve, Robin
dc.contributor.authorClima, Sergiu
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorKundu, Shreya
dc.contributor.authorHody, Hubert
dc.contributor.authorDevulder, Wouter
dc.contributor.authorPotoms, Goedele
dc.contributor.authorPeissker, Tobias
dc.contributor.authorNyns, Laura
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2025-02-27T08:35:27Z
dc.date.available2024-01-25T17:38:28Z
dc.date.available2025-02-27T08:35:27Z
dc.date.issued2024
dc.identifier.issn1862-6254
dc.identifier.otherWOS:001144692000001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43453.2
dc.sourceWOS
dc.titleEvidence of Heat-Assisted Atomic Migration in GeSe Self-Selecting Memory at High Operating Current Density
dc.typeJournal article
dc.contributor.imecauthorRavsher, Taras
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorHody, Hubert
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorPotoms, Goedele
dc.contributor.imecauthorPeissker, Tobias
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecRavsher, Taras::0000-0001-7862-5973
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecDegraeve, Robin::0000-0002-4609-5573
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecKundu, Shreya::0000-0001-8052-7774
dc.contributor.orcidimecHody, Hubert::0009-0000-1407-8755
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecPotoms, Goedele::0009-0008-0720-0044
dc.contributor.orcidimecPeissker, Tobias::0000-0003-1637-0033
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecBelmonte, Attilio::0000-0002-3947-1948
dc.contributor.orcidimecDonadio, Gabriele Luca::0000-0003-1435-3897
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.identifier.doi10.1002/pssr.202300415
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.beginpageArt. 2300415
dc.source.endpageN/A
dc.source.journalPHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
dc.source.issue10
dc.source.volume18
imec.availabilityPublished - imec
dc.description.wosFundingTextThe authors would like to thank A. Nalin Mehta, Maxim Korytov, and O. Richard for the support with TEM sample preparation and analysis. This work was carried out in the framework of the imec Core CMOS - Active Memory Program. T.R. acknowledges the support by Research Foundation - Flanders (FWO) for providing funding via a strategic basic research PhD fellowship (grant no. 1SD4721).


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220.500.12860/43453.2*2025-02-27T08:33:00Zvalidation by library/open access desk
120.500.12860/434532024-01-25T17:38:28Z

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