dc.contributor.author | Tiwari, Sabyasachi | |
dc.contributor.author | van de Put, Maarten | |
dc.contributor.author | Soree, Bart | |
dc.contributor.author | Hinkle, Christopher | |
dc.contributor.author | Vandenberghe, William G. | |
dc.date.accessioned | 2025-08-20T08:46:02Z | |
dc.date.available | 2024-02-11T17:06:52Z | |
dc.date.available | 2025-08-20T08:46:02Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 1944-8244 | |
dc.identifier.other | WOS:001155511900001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43533.2 | |
dc.source | WOS | |
dc.title | Reduction of Magnetic Interaction Due to Clustering in Doped Transition-Metal Dichalcogenides: A Case Study of Mn-, V-, and Fe-Doped WSe2 | |
dc.type | Journal article | |
dc.contributor.imecauthor | Tiwari, Sabyasachi | |
dc.contributor.imecauthor | van de Put, Maarten | |
dc.contributor.imecauthor | Soree, Bart | |
dc.contributor.orcidimec | Tiwari, Sabyasachi::0000-0002-2216-3893 | |
dc.contributor.orcidimec | Van de Put, Maarten::0000-0001-9179-6443 | |
dc.contributor.orcidimec | Soree, Bart::0000-0002-4157-1956 | |
dc.identifier.doi | 10.1021/acsami.3c14114 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 4991 | |
dc.source.endpage | 4998 | |
dc.source.journal | ACS APPLIED MATERIALS & INTERFACES | |
dc.identifier.pmid | MEDLINE:38235733 | |
dc.source.issue | 4 | |
dc.source.volume | 16 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The project or effort depicted was or is sponsored by the Department of Defense, Defense Threat Reduction Agency. The content of the information does not necessarily reflect the position or the policy of the federal government, and no official endorsement should be inferred. This work at the University of Texas at Dallas is supported by the Office of Naval Research (ONR) under grant no. N00014-23-1-2020. This work was supported in part by NEWLIMITS, a center in nCORE, a Semiconductor Research Corporation (SRC) program sponsored by NIST through award number 70NANB17H041. This work was also supported in part by SUPREME, one of seven centers in JUMP 2.0, a Semiconductor Research Corporation (SRC) program sponsored by DARPA. This work was supported by imec's Industrial Affiliation Program. | |