dc.contributor.author | Zborowski, Charlotte | |
dc.contributor.author | Vanleenhove, Anja | |
dc.contributor.author | Hoflijk, Ilse | |
dc.contributor.author | Vaesen, Inge | |
dc.contributor.author | Artyushkova, K. | |
dc.contributor.author | Conard, Thierry | |
dc.date.accessioned | 2024-04-22T13:24:01Z | |
dc.date.available | 2024-03-17T17:57:07Z | |
dc.date.available | 2024-04-22T13:24:01Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 1055-5269 | |
dc.identifier.other | WOS:001168691100001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43693.2 | |
dc.source | WOS | |
dc.title | HAXPES Cr Kα measurement of bulk indium | |
dc.type | Journal article | |
dc.contributor.imecauthor | Zborowski, Charlotte | |
dc.contributor.imecauthor | Vanleenhove, Anja | |
dc.contributor.imecauthor | Hoflijk, Ilse | |
dc.contributor.imecauthor | Vaesen, Inge | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.orcidimec | Vanleenhove, Anja::0000-0001-5481-9642 | |
dc.contributor.orcidimec | Vaesen, Inge::0000-0003-3533-4679 | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.identifier.doi | 10.1116/6.0003161 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 024034 | |
dc.source.endpage | N/A | |
dc.source.journal | SURFACE SCIENCE SPECTRA | |
dc.source.issue | 2 | |
dc.source.volume | 30 | |
imec.availability | Published - imec | |