dc.contributor.author | Baryshnikova, Marina | |
dc.contributor.author | Boelen, Andries | |
dc.contributor.author | Ceccon, Luca | |
dc.contributor.author | Herreman, Vincent | |
dc.contributor.author | McMitchell, Sean | |
dc.contributor.author | Haffner, Christian | |
dc.contributor.author | Merckling, Clement | |
dc.date.accessioned | 2024-08-06T08:15:53Z | |
dc.date.available | 2024-05-11T18:25:18Z | |
dc.date.available | 2024-08-06T08:15:53Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 1996-1944 | |
dc.identifier.other | WOS:001211367600001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43926.2 | |
dc.source | WOS | |
dc.title | Impact of Cationic Stoichiometry on Physical, Optical and Electrical Properties of SrTiO3 Thin Films Grown on (001)-Oriented Si Substrates | |
dc.type | Journal article | |
dc.contributor.imecauthor | Baryshnikova, Marina | |
dc.contributor.imecauthor | Boelen, Andries | |
dc.contributor.imecauthor | Ceccon, Luca | |
dc.contributor.imecauthor | Herreman, Vincent | |
dc.contributor.imecauthor | Haffner, Christian | |
dc.contributor.imecauthor | Merckling, Clement | |
dc.contributor.imecauthor | McMitchell, Sean | |
dc.contributor.orcidimec | Baryshnikova, Marina::0000-0002-5945-4459 | |
dc.contributor.orcidimec | Boelen, Andries::0000-0002-5380-7348 | |
dc.contributor.orcidimec | Ceccon, Luca::0000-0002-8147-8713 | |
dc.contributor.orcidimec | Haffner, Christian::0000-0002-8947-5293 | |
dc.contributor.orcidimec | Merckling, Clement::0000-0003-3084-2543 | |
dc.contributor.orcidimec | McMitchell, Sean::0000-0002-9916-0973 | |
dc.date.embargo | 42024-04-09 | |
dc.identifier.doi | 10.3390/ma17081714 | |
dc.source.numberofpages | 14 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 1714 | |
dc.source.endpage | N/A | |
dc.source.journal | MATERIALS | |
dc.identifier.pmid | MEDLINE:38673072 | |
dc.source.issue | 8 | |
dc.source.volume | 17 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The authors extend their gratitude to the Material and Component Analysis department at Imec for their invaluable assistance with sample characterization. Special recognition is given to Olivier Richard for his guidance on interpreting the TEM results, Johan Meersschaut for executing the RBS investigation and Robert Gehlhaar for his support in constructing an ellipsometry model. A heartfelt thank you goes to Hans Costermans and Kevin Dubois for their exceptional assistance with the MBE cluster tool. Additionally, the authors express their appreciation to Professor Valeri Afanasiev from KUL for his insights into the changes in optical properties observed in STO samples. | |