dc.contributor.author | Alavi, Omid | |
dc.contributor.author | De Ceuninck, Ward | |
dc.contributor.author | Daenen, Michaël | |
dc.date.accessioned | 2024-08-06T07:43:40Z | |
dc.date.available | 2024-06-20T18:15:37Z | |
dc.date.available | 2024-08-06T07:43:40Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 1996-1073 | |
dc.identifier.other | WOS:001245556600001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44067.2 | |
dc.source | WOS | |
dc.title | Optimizing Insulated-Gate Bipolar Transistors' Lifetime Estimation: A Critical Evaluation of Lifetime Model Adjustments Based on Power Cycling Tests | |
dc.type | Journal article | |
dc.contributor.imecauthor | Alavi, Omid | |
dc.contributor.imecauthor | De Ceuninck, Ward | |
dc.contributor.imecauthor | Daenen, Michaël | |
dc.contributor.orcidimec | Alavi, Omid::0000-0001-6426-8485 | |
dc.contributor.orcidimec | De Ceuninck, Ward::0000-0002-4630-5569 | |
dc.contributor.orcidimec | Daenen, Michaël::0000-0002-9221-4932 | |
dc.date.embargo | 2024-05-29 | |
dc.identifier.doi | 10.3390/en17112616 | |
dc.source.numberofpages | 23 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Art. 2616 | |
dc.source.endpage | N/A | |
dc.source.journal | ENERGIES | |
dc.source.issue | 11 | |
dc.source.volume | 17 | |
imec.availability | Published - open access | |
dc.description.wosFundingText | No Statement Available | |