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Highly conductive diamond probes for scanning spreading resistance microscopy

dc.contributor.authorHantschel, Thomas
dc.contributor.authorNiedermann, P.
dc.contributor.authorTrenkler, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-14T13:02:33Z
dc.date.available2021-10-14T13:02:33Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4415
dc.sourceIIOimport
dc.titleHighly conductive diamond probes for scanning spreading resistance microscopy
dc.typeJournal article
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1603
dc.source.endpage1605
dc.source.journalApplied Physics Letters
dc.source.issue12
dc.source.volume76
imec.availabilityPublished - open access


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