dc.contributor.author | Deng, Jian | |
dc.contributor.author | Renders, Jens | |
dc.contributor.author | Meenaketan, Babu Linkoon | |
dc.contributor.author | Ebrahimi Takalloo, Saeedeh | |
dc.contributor.author | Braeken, Dries | |
dc.contributor.author | De Beenhouwer, Jan | |
dc.contributor.author | Sijbers, Jan | |
dc.date.accessioned | 2024-11-06T08:58:40Z | |
dc.date.available | 2024-09-29T18:03:40Z | |
dc.date.available | 2024-11-06T08:58:40Z | |
dc.date.issued | 2024 | |
dc.identifier.issn | 1530-437X | |
dc.identifier.other | WOS:001285340000049 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44586.2 | |
dc.source | WOS | |
dc.title | Imaging Algorithm and Optimal Measurement Protocol for 3-D Impedance Tomography on 2-D High-Density Microelectrode Array | |
dc.type | Journal article | |
dc.contributor.imecauthor | Deng, Jian | |
dc.contributor.imecauthor | Renders, Jens | |
dc.contributor.imecauthor | Braeken, Dries | |
dc.contributor.imecauthor | De Beenhouwer, Jan | |
dc.contributor.imecauthor | Sijbers, Jan | |
dc.contributor.imecauthor | Meenaketan, Babu Linkoon | |
dc.contributor.imecauthor | Ebrahimi Takalloo, Saeedeh | |
dc.contributor.orcidimec | Deng, Jian::0000-0001-5106-1581 | |
dc.contributor.orcidimec | Renders, Jens::0000-0003-4327-7328 | |
dc.contributor.orcidimec | Braeken, Dries::0000-0002-5752-3203 | |
dc.contributor.orcidimec | De Beenhouwer, Jan::0000-0001-5253-1274 | |
dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
dc.contributor.orcidimec | Ebrahimi Takalloo, Saeedeh::0000-0003-3679-8125 | |
dc.identifier.doi | 10.1109/JSEN.2024.3417289 | |
dc.source.numberofpages | 14 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 24452 | |
dc.source.endpage | 24465 | |
dc.source.journal | IEEE SENSORS JOURNAL | |
dc.source.issue | 15 | |
dc.source.volume | 24 | |
imec.availability | Published - imec | |
dc.description.wosFundingText | The work of Jens Renders was supported by the Research Foundation Flanders under Grant 1SA2920N. | |