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dc.contributor.authorDeng, Jian
dc.contributor.authorRenders, Jens
dc.contributor.authorMeenaketan, Babu Linkoon
dc.contributor.authorEbrahimi Takalloo, Saeedeh
dc.contributor.authorBraeken, Dries
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSijbers, Jan
dc.date.accessioned2024-11-06T08:58:40Z
dc.date.available2024-09-29T18:03:40Z
dc.date.available2024-11-06T08:58:40Z
dc.date.issued2024
dc.identifier.issn1530-437X
dc.identifier.otherWOS:001285340000049
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44586.2
dc.sourceWOS
dc.titleImaging Algorithm and Optimal Measurement Protocol for 3-D Impedance Tomography on 2-D High-Density Microelectrode Array
dc.typeJournal article
dc.contributor.imecauthorDeng, Jian
dc.contributor.imecauthorRenders, Jens
dc.contributor.imecauthorBraeken, Dries
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorMeenaketan, Babu Linkoon
dc.contributor.imecauthorEbrahimi Takalloo, Saeedeh
dc.contributor.orcidimecDeng, Jian::0000-0001-5106-1581
dc.contributor.orcidimecRenders, Jens::0000-0003-4327-7328
dc.contributor.orcidimecBraeken, Dries::0000-0002-5752-3203
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecEbrahimi Takalloo, Saeedeh::0000-0003-3679-8125
dc.identifier.doi10.1109/JSEN.2024.3417289
dc.source.numberofpages14
dc.source.peerreviewyes
dc.source.beginpage24452
dc.source.endpage24465
dc.source.journalIEEE SENSORS JOURNAL
dc.source.issue15
dc.source.volume24
imec.availabilityPublished - imec
dc.description.wosFundingTextThe work of Jens Renders was supported by the Research Foundation Flanders under Grant 1SA2920N.


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