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dc.contributor.authorGoegebeur, Samuel
dc.contributor.authorDeprez, Kenneth
dc.contributor.authorColombi, Davide
dc.contributor.authorBischoff, Jens Eilers
dc.contributor.authorDi Paola, Carla
dc.contributor.authorStroobandt, Bram
dc.contributor.authorVerloock, Leen
dc.contributor.authorAerts, Sam
dc.contributor.authorTornevik, Christer
dc.contributor.authorJoseph, Wout
dc.date.accessioned2024-11-19T08:51:19Z
dc.date.available2024-10-12T18:13:35Z
dc.date.available2024-11-19T08:51:19Z
dc.date.issued2024
dc.identifier.issn2169-3536
dc.identifier.otherWOS:001327281800001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44630.2
dc.sourceWOS
dc.titleA Comparative Study of In Situ Methodologies for Assessment of RF EMF Exposure From a 5G FR2 Base Station
dc.typeJournal article
dc.contributor.imecauthorGoegebeur, Samuel
dc.contributor.imecauthorDeprez, Kenneth
dc.contributor.imecauthorStroobandt, Bram
dc.contributor.imecauthorVerloock, Leen
dc.contributor.imecauthorJoseph, Wout
dc.contributor.orcidimecGoegebeur, Samuel::0000-0001-7527-2885
dc.contributor.orcidimecDeprez, Kenneth::0000-0002-1954-6738
dc.contributor.orcidimecStroobandt, Bram::0000-0003-2377-4300
dc.contributor.orcidimecVerloock, Leen::0000-0001-8392-3481
dc.contributor.orcidimecJoseph, Wout::0000-0002-8807-0673
dc.date.embargo2024-07-05
dc.identifier.doi10.1109/ACCESS.2024.3424262
dc.source.numberofpages13
dc.source.peerreviewyes
dc.source.beginpage132552
dc.source.endpage132564
dc.source.journalIEEE ACCESS
dc.source.issueN/A
dc.source.volume12
imec.availabilityPublished - open access


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