Interaction of Ti capped Co thin film with Si3N4
dc.contributor.author | Li, Hua | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Maex, Karen | |
dc.contributor.author | Gutakovskii, A. | |
dc.contributor.author | Van Landuyt, J. | |
dc.contributor.author | Froyen, L. | |
dc.date.accessioned | 2021-10-14T13:15:42Z | |
dc.date.available | 2021-10-14T13:15:42Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4527 | |
dc.source | IIOimport | |
dc.title | Interaction of Ti capped Co thin film with Si3N4 | |
dc.type | Journal article | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Maex, Karen | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 4307 | |
dc.source.endpage | 9 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 26 | |
dc.source.volume | 77 | |
imec.availability | Published - open access |