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A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs

dc.contributor.authorWatté, J.
dc.contributor.authorWuyts, Koen
dc.contributor.authorSilverans, R. E.
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorVan Rossum, Marc
dc.date.accessioned2021-09-29T12:53:16Z
dc.date.available2021-09-29T12:53:16Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/458
dc.sourceIIOimport
dc.titleA Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage2055
dc.source.endpage2060
dc.source.journalJournal of Applied Physics
dc.source.volume75
imec.availabilityPublished - imec


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