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Electrical modeling of interface roughness in thin film electroluminescent devices

dc.contributor.authorNeyts, K.
dc.contributor.authorDe Visschere, Patrick
dc.contributor.authorSoenen, B.
dc.contributor.authorStuyven, G.
dc.date.accessioned2021-10-14T13:27:28Z
dc.date.available2021-10-14T13:27:28Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4615
dc.sourceIIOimport
dc.titleElectrical modeling of interface roughness in thin film electroluminescent devices
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage318
dc.source.endpage325
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue2
dc.source.volume47
imec.availabilityPublished - open access


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