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Experimental verfication of pattern selection for noise characterization

dc.contributor.authorVan Den Bosch, Sven
dc.contributor.authorMartens, Luc
dc.date.accessioned2021-10-14T13:58:06Z
dc.date.available2021-10-14T13:58:06Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4816
dc.sourceIIOimport
dc.titleExperimental verfication of pattern selection for noise characterization
dc.typeJournal article
dc.contributor.imecauthorMartens, Luc
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage156
dc.source.endpage158
dc.source.journalIEEE Trans. Microwave Theory and Techniques
dc.source.issue1
dc.source.volume48
imec.availabilityPublished - open access


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