Show simple item record

Analysis and experimental verification of digital substrate noise generation for epi-type substrates

dc.contributor.authorVan Heijningen, Marc
dc.contributor.authorCompiet, John
dc.contributor.authorWambacq, P.
dc.contributor.authorDonnay, Stephane
dc.contributor.authorEngels, Marc
dc.contributor.authorBolsens, Ivo
dc.date.accessioned2021-10-14T13:59:34Z
dc.date.available2021-10-14T13:59:34Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4825
dc.sourceIIOimport
dc.titleAnalysis and experimental verification of digital substrate noise generation for epi-type substrates
dc.typeJournal article
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage1002
dc.source.endpage1008
dc.source.journalIEEE Journal of Solid-State Circuits
dc.source.issue7
dc.source.volume35
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record