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Critical discussion on unified 1/f noise models for MOSFETs

dc.contributor.authorVandamme, Ewout
dc.contributor.authorVandamme, Lorenz
dc.date.accessioned2021-10-14T14:05:41Z
dc.date.available2021-10-14T14:05:41Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4863
dc.sourceIIOimport
dc.titleCritical discussion on unified 1/f noise models for MOSFETs
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2146
dc.source.endpage5152
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue11
dc.source.volume47
imec.availabilityPublished - open access


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