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Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality

dc.contributor.authorVandamme, Ewout
dc.contributor.authorVandamme, Lorenz
dc.date.accessioned2021-10-14T14:05:51Z
dc.date.available2021-10-14T14:05:51Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4864
dc.sourceIIOimport
dc.titleCurrent crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1847
dc.source.endpage1853
dc.source.journalMicroelectronics Reliability
dc.source.issue11
dc.source.volume40
imec.availabilityPublished - imec


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