Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality
dc.contributor.author | Vandamme, Ewout | |
dc.contributor.author | Vandamme, Lorenz | |
dc.date.accessioned | 2021-10-14T14:05:51Z | |
dc.date.available | 2021-10-14T14:05:51Z | |
dc.date.issued | 2000 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4864 | |
dc.source | IIOimport | |
dc.title | Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality | |
dc.type | Journal article | |
dc.source.peerreview | no | |
dc.source.beginpage | 1847 | |
dc.source.endpage | 1853 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 11 | |
dc.source.volume | 40 | |
imec.availability | Published - imec |
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