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A new approach for the calculation of line capacitances of two-layer IC interconnects

dc.contributor.authorYmeri, Hasan
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorMaex, Karen
dc.contributor.authorDe Roest, David
dc.date.accessioned2021-10-14T14:22:59Z
dc.date.available2021-10-14T14:22:59Z
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4962
dc.sourceIIOimport
dc.titleA new approach for the calculation of line capacitances of two-layer IC interconnects
dc.typeJournal article
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorDe Roest, David
dc.source.peerreviewno
dc.source.beginpage297
dc.source.endpage302
dc.source.journalIEEE Microwave and Optical Technology Letters
dc.source.issue5
dc.source.volume27
imec.availabilityPublished - imec


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