Browsing Articles by author "Fahrner, W."
Now showing items 1-2 of 2
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Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Simoen, Eddy; Claeys, Cor; Loo, Roger; De Gryse, O.; Clauws, P.; Job, R.; Ulyashin, A.G.; Fahrner, W. (2003) -
Substrate orientation, doping and plasma frequency dependencies of structural defect formation in hydrogen plasma treated silicon
Ulyashin, A.; Job, R.; Fahrner, W.; Richard, Olivier; Bender, Hugo; Claeys, Cor; Simoen, Eddy; Grambole, D. (2002)