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Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Publication:
Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Date
2003
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Loo, Roger
;
De Gryse, O.
;
Clauws, P.
;
Job, R.
;
Ulyashin, A.G.
;
Fahrner, W.
Journal
Materials Science and Engineering B
Abstract
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1947
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1947
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations