Browsing Articles by imec author "45289fa647909ddca87330eb19427ec79f112c77"
Now showing items 1-14 of 14
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3D Packaging issues for ultrasmall systems-in-a-cube
Snoeckx, Koen; De Moor, Piet; De Munck, Koen; Beyne, Eric (2005-04) -
A Backside-Illuminated Charge-Focusing Silicon SPAD With Enhanced Near-Infrared Sensitivity
Van Sieleghem, Edward; Karve, Gauri; De Munck, Koen; Vinci, Andrea; Cavaco, Celso; Suess, Andreas; Van Hoof, Chris; Lee, Jiwon (2022) -
A Near-Infrared Enhanced Silicon Single-Photon Avalanche Diode With a Spherically Uniform Electric Field Peak
Van Sieleghem, Edward; Suss, Andreas; Boulenc, Pierre; Lee, Jiwon; Karve, Gauri; De Munck, Koen; Cavaco, Celso; Van Hoof, Chris (2021) -
Backside illuminated CMOS image sensors optimized by modeling and simulation
Minoglou, Kiki; Ramachandra Rao, Padmakumar; Rahman, Muhammad; De Munck, Koen; Van Hoof, Chris; De Moor, Piet (2011) -
Backside thinned CMOS imagers with high broadband quantum efficiency realised using a new integration process
De Munck, Koen; Bogaerts, Jan; Sabuncuoglu Tezcan, Deniz; De Moor, Piet; Sedky, Sherif; Van Hoof, Chris (2008) -
Development of gated pinned avalanche photodiode pixels for high-speed low-light imaging
Resetar, Tomislav; De Munck, Koen; Haspeslagh, Luc; Rosmeulen, Maarten; Suss, Andreas; Puers, Bob; Van Hoof, Chris (2016) -
Edgeless silicon sensors for Medipix-based large-area X-ray imaging detectors
Bosma, M.J.; Visser, J.; Evrard, O.; De Moor, Piet; De Munck, Koen; Sabuncuoglu Tezcan, Deniz; Koffeman, E.N. (2011) -
First demonstration of hybrid CMOS imagers with simultaneous very low crosstalk and high-broadband quantum efficiency
Minoglou, Kiki; De Munck, Koen; De Vos, Joeri; Sabuncuoglu Tezcan, Deniz; Van Hoof, Chris; De Moor, Piet (2012) -
Influence of extreme thinning on 130nm CMOS devices for 3D integration
De Munck, Koen; Chiarella, Thomas; De Moor, Piet; Swinnen, Bart; Van Hoof, Chris (2008) -
On the processing aspects of high performance hybrid backside
De Vos, Joeri; De Munck, Koen; Minoglou, Kiki; Ramachandra Rao, Padmakumar; Erismis, Mehmet Akif; De Moor, Piet; Sabuncuoglu Tezcan, Deniz (2011) -
Process induced sub-surface damage in mechanically ground silicon wafers
Yang, Yu; De Munck, Koen; Cotrin Teixeira, Ricardo; Swinnen, Bart; Verlinden, Bert; De Wolf, Ingrid (2008-07) -
Quantum efficiency and dark current evaluation of a backside illuminated CMOS image sensor
Vereecke, Bart; Cavaco, Celso; De Munck, Koen; Haspeslagh, Luc; Minoglou, Kiki; Moore, George; Sabuncuoglu Tezcan, Deniz; Tack, Klaas; Wu, Bob; Osman, Haris (2015) -
Stress analysis on ultra thin ground wafers
Cotrin Teixeira, Ricardo; De Munck, Koen; De Moor, Piet; Baert, Kris; Swinnen, Bart; Van Hoof, Chris; Knüttel, Alexander (2008) -
The RELAXd project: Development of four-side tilable photon-counting imagers
Vykydal, Zdenek; Visschers, Jan; Sabuncuoglu Tezcan, Deniz; De Munck, Koen; Borgers, Tom; Ruythooren, Wouter; De Moor, Piet (2008)