Browsing Articles by imec author "4885b2033b05d59e4e2b34fcd9f7f8da28b23980"
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Built-in sheet charge as an alternative to dopant pockets in tunnel field-effect transistors
Verreck, Devin; Verhulst, Anne; Xiang, Yang; Yakimets, Dmitry; El Kazzi, Salim; Parvais, Bertrand; Groeseneken, Guido; Collaert, Nadine; Mocuta, Anda (2018) -
CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling
Liu, Hsiao-Hsuan; Salahuddin, Shairfe Muhammad; Chan, Boon Teik; Schuddinck, Pieter; Xiang, Yang; Hellings, Geert; Weckx, Pieter; Ryckaert, Julien; Catthoor, Francky (2023) -
CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark
Liu, Hsiao-Hsuan; Schuddinck, Pieter; Pei, Zhenlin; Verschueren, Lynn; Mertens, Hans; Salahuddin, Shairfe Muhammad; Hiblot, Gaspard; Xiang, Yang; Chan, Boon Teik; Subramanian, Sujith; Weckx, Pieter; Hellings, Geert; Garcia Bardon, Marie; Ryckaert, Julien; Pan, Chenyun; Catthoor, Francky (2023) -
Compact Modeling of Multidomain Ferroelectric FETs: Charge Trapping, Channel Percolation, and Nucleation-Growth Domain Dynamics
Xiang, Yang; Garcia Bardon, Marie; Kaczer, Ben; Alam, Md Nur Kutubul; Ragnarsson, Lars-Ake; Kaczmarek, Kuba; Parvais, Bertrand; Groeseneken, Guido; Van Houdt, Jan (2021) -
Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3 nm Era
Sisto, Giuliano; Zografos, Odysseas; Chehab, Bilal; Kakarla, Naveen; Xiang, Yang; Milojevic, Dragomir; Weckx, Pieter; Hellings, Geert; Ryckaert, Julien (2022) -
Process-induced power-performance variability in sub-5nm III-V tunnel FETs
Xiang, Yang; Verhulst, Anne; Yakimets, Dmitry; Parvais, Bertrand; Mocuta, Anda; Groeseneken, Guido (2019-04) -
Variability in Planar FeFETs-Channel Percolation Impact
Kaczmarek, Jakub; Garcia Bardon, Marie; Xiang, Yang; Ronchi, Nicolo; Ragnarsson, Lars-Ake; Celano, Umberto; Banerjee, Kaustuv; Kaczer, Ben; Groeseneken, Guido; Van Houdt, Jan (2023)