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Process-induced power-performance variability in sub-5nm III-V tunnel FETs
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Authors
Xiang, Yang
;
Verhulst, Anne
;
Yakimets, Dmitry
;
Parvais, Bertrand
;
Mocuta, Anda
;
Groeseneken, Guido
DOI
10.1109/TED.2019.2909217
ISSN
0018-9383
Issue
6
Journal
IEEE Transactions on Electron Devices
Volume
66
Title
Process-induced power-performance variability in sub-5nm III-V tunnel FETs
Publication type
Journal article
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