Browsing Articles by imec author "ac9fdea722352c1d5cd613a9113edc842a08cc57"
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The impact of focused ion beam induced damage on scanning spreading resistance microscopy
Pandey, Komal; Paredis, Kristof; Hantschel, Thomas; Drijbooms, Chris; Vandervorst, Wilfried (2020) -
Understanding the effect of confinement in scanning spreading resistance microscopy measurements
Pandey, Komal; Paredis, Kristof; Robson, Alexander; Vandervorst, Wilfried (2020)