Browsing Articles by author "Nafria, Montse"
Now showing items 1-2 of 2
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Gate voltage influence on the channel hot-carrier degradation of high-k-based devices
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Groeseneken, Guido (2011) -
SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors
Martin Martinez, Javier; Amat, Esteve; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, Rosana; Nafria, Montse; Aymerich, Xavier; Simoen, Eddy (2010)