Gate voltage influence on the channel hot-carrier degradation of high-k-based devices

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Authors

Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafria, Montse; Aymerich, Xavier; Groeseneken, Guido

ISSN

1530-4388

Issue

1

Journal

IEEE Transactions on Device and Materials Reliability

Volume

11

Title

Gate voltage influence on the channel hot-carrier degradation of high-k-based devices

Publication type

Journal article

Embargo date

9999-12-31

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