Publication:
Gate voltage influence on the channel hot-carrier degradation of high-k-based devices
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1959 since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1959 since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations