Browsing Articles by imec author "e460dc949418739bfc1d74fadc05d77a840c7fb5"
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Diamond scanning probes with sub-nanometer resolution for advanced nanoelectronics device characterization
Hantschel, Thomas; Tsigkourakos, Menelaos; Zha, Lichen; Nuytten, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2016) -
Overcoated diamond tips for nanometer-scale semiconductor device characterization
Hantschel, Thomas; Tsigkourakos, Menelaos; Kluge, Julia; Werner, Thilo; Zha, Lichen; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Xu, Blair; Vandervorst, Wilfried (2015)