Browsing Articles by imec author "9aba769f411ac4f70d8869b3dce957d2a2de6589"
Now showing items 21-40 of 78
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Characterising differences between measurement and calibration wafer in probe-tip calibrations
Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter; Schreurs, Dominique; Vandenberghe, S. (1999) -
Characteristic impedance extraction using calibration comparison
Vandenberghe, S.; Schreurs, Dominique; Carchon, Geert; Nauwelaers, Bart; De Raedt, Walter (2001) -
Complex permittivity measurement method based on asymmetry of reciprocal two-ports
Wan, C.; Nauwelaers, Bart; De Raedt, Walter; Van Rossum, Marc (1996) -
Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen (2000) -
Consistent small-signal and large-signal extraction techniques for heterojunction FET's
Jansen, Philippe; Schreurs, Dominique; De Raedt, Walter; Nauwelaers, Bart; Van Rossum, Marc (1995) -
DC, LF dispersion and RF characterisation of short-time stressed InP based LM-HEMTs
Schreurs, Dominique; Spiers, Ariane; De Raedt, Walter; van der Zanden, Koen; Baeyens, Yves; Van Hove, Marleen; Nauwelaers, Bart; Van Rossum, Marc (1996) -
Design and comparison of resonant and non-resonant single-layer microwave heaters for continuous flow microfluidics in silicon-glass technology
Markovic, Tomislav; Ocket, Ilja; Baric, Adrijan; Nauwelaers, Bart (2020) -
Design of microwave MCM-D CPW quadrature couplers and power dividers in X-, Ku-, and Ka-band
Carchon, Geert; Brebels, Steven; Vaesen, Kristof; Pieters, Philip; De Raedt, Walter; Nauwelaers, Bart; Beyne, Eric (2000) -
Detailed analysis of parasitic loading effects on power performance of GaN-on-Silicon HEMTs
Xiao, Dongping; Schreurs, Dominique; De Raedt, Walter; Derluyn, Joff; Germain, Marianne; Nauwelaers, Bart; Borghs, Gustaaf (2009-12) -
Dielectric-based temperature sensing of nanoliter water samples with a post-processing tuned matching network
Maenhout, Gertjan; Markovic, Tomislav; Bao, Juncheng; Stefanidis, Georgios; Ocket, Ilja; Nauwelaers, Bart (2020) -
Distributed inductance and resistance per-unit-length formulas for VLSI interconnects on silicon substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen (2001) -
Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors
Abou-Khalil, M.; Schreurs, Dominique; Nauwelaers, Bart; Van Rossum, Marc; Maciejko, R.; Wuyts, Koen (1997) -
Effect of open-ended coaxial probe-to-tissue contact pressure on dielectric measurements
Maenhout, Gertjan; Markovic, Tomislav; Ocket, Ilja; Nauwelaers, Bart (2020) -
Efficient procedure for capacitance matrix calculation of multilayer VLSI interconnects using quasi-static analysis and Fourier series approach
Ymeri, Hassan; Nauwelaers, Bart; Maex, Karen (2002) -
Electrical characterisation of the BGA package for RF applications
Chandrasekhar, Arun; Beyne, Eric; De Raedt, Walter; Nauwelaers, Bart; Van Bever, T. (2002) -
Fast and accurate analysis of the multiconductor interconnects
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David (2001) -
Filter-through device: a distributed RF-MEMS capacitive series switch
Rottenberg, Xavier; Mertens, Robert; Nauwelaers, Bart; De Raedt, Walter; Tilmans, Harrie (2005) -
Frequency-dependent expressions for inductance and resistance of microstrip line on silicon substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David; Vandenberghe, S. (2002) -
Frequency-dependent line capacitance and conductance calculations of on-chip interconnects on silicon substrate using Fourier cosine series approach
Ymeri, Hasan; Nauwelaers, Bart; Vandenberghe, S.; Maex, Karen; De Roest, David; Stucchi, Michele (2001) -
Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen (2001)