DC, LF dispersion and RF characterisation of short-time stressed InP based LM-HEMTs

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Authors
Schreurs, Dominique; Spiers, Ariane; De Raedt, Walter; van der Zanden, Koen; Baeyens, Yves; Van Hove, Marleen; Nauwelaers, Bart; Van Rossum, Marc
Journal
Microelectronics and Reliability
Volume
36
Title
DC, LF dispersion and RF characterisation of short-time stressed InP based LM-HEMTs
Publication type
Journal article
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