Publication:

DC, LF dispersion and RF characterisation of short-time stressed InP based LM-HEMTs

Date

1996
Journal article
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Author(s)

Schreurs, Dominique  
;
Spiers, Ariane
;
De Raedt, Walter  
;
van der Zanden, Koen
;
Baeyens, Yves
;
Van Hove, Marleen
;
Nauwelaers, Bart  
;
Van Rossum, Marc

Journal

Microelectronics and Reliability

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1984 since deposited on 2021-09-29
Acq. date: 2025-10-24

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1984 since deposited on 2021-09-29
Acq. date: 2025-10-24

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