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Gate oxide evaluation by characterisation of oxide breakdown

dc.contributor.authorBearda, Twan
dc.date.accessioned2021-10-14T16:36:56Z
dc.date.available2021-10-14T16:36:56Z
dc.date.issued2001-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5047
dc.sourceIIOimport
dc.titleGate oxide evaluation by characterisation of oxide breakdown
dc.typePHD thesis
dc.source.peerreviewno
dc.contributor.thesisadvisorWoerlee, P.H.
dc.contributor.thesisadvisorWallinga, H.
imec.availabilityPublished - imec


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