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Electrical defect study in thin-film SiGe/Si solar cells

dc.contributor.authorDaami, A.
dc.contributor.authorZerrai, A.
dc.contributor.authorMarchand, J. J.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorBremond, G.
dc.date.accessioned2021-10-14T16:44:33Z
dc.date.available2021-10-14T16:44:33Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5178
dc.sourceIIOimport
dc.titleElectrical defect study in thin-film SiGe/Si solar cells
dc.typeJournal article
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage331
dc.source.endpage334
dc.source.journalMaterials Science in Semiconductor Processing
dc.source.issue1_3
dc.source.volume4
imec.availabilityPublished - imec


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