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Degradation and time dependent breakdown of stressed ferromagnetic tunnel junctions

dc.contributor.authorDas, Johan
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBoeve, Hans
dc.contributor.authorDuchamps, Petra
dc.contributor.authorLagae, Liesbet
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorDe Boeck, Jo
dc.date.accessioned2021-10-14T16:45:15Z
dc.date.available2021-10-14T16:45:15Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5186
dc.sourceIIOimport
dc.titleDegradation and time dependent breakdown of stressed ferromagnetic tunnel junctions
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorDe Boeck, Jo
dc.source.peerreviewno
dc.source.beginpage7350
dc.source.endpage7352
dc.source.journalJournal of Applied Physics
dc.source.issue11
dc.source.volume89
imec.availabilityPublished - imec
imec.internalnotesPaper from the 8th Joint MMM-Intermag Conference; 7-11 January 2001; San Antonio, TX,USA


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