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dc.contributor.authorDas, Johan
dc.contributor.authorDegraeve, Robin
dc.contributor.authorBoeve, Hans
dc.contributor.authorDuchamps, Petra
dc.contributor.authorLagae, Liesbet
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorDe Boeck, Jo
dc.date.accessioned2021-10-14T16:45:21Z
dc.date.available2021-10-14T16:45:21Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5187
dc.sourceIIOimport
dc.titleTunnel barrier properties of stressed ferromagnetic tunnel junctions
dc.typeJournal article
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorDe Boeck, Jo
dc.source.peerreviewno
dc.source.beginpage356
dc.source.endpage358
dc.source.journalElectronics Letters
dc.source.issue6
dc.source.volume37
imec.availabilityPublished - imec


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