Hot carrier degradation and ESD in submicrometer CMOS technologies: how do they interact?
| dc.contributor.author | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-14T16:59:36Z | |
| dc.date.available | 2021-10-14T16:59:36Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5324 | |
| dc.source | IIOimport | |
| dc.title | Hot carrier degradation and ESD in submicrometer CMOS technologies: how do they interact? | |
| dc.type | Journal article | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.source.peerreview | no | |
| dc.source.beginpage | 23 | |
| dc.source.endpage | 32 | |
| dc.source.journal | IEEE Trans. Device and Materials Reliability | |
| dc.source.issue | 1 | |
| dc.source.volume | 1 | |
| imec.availability | Published - imec |
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