dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Naili, Mohamed | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Stesmans, Andre | |
dc.date.accessioned | 2021-10-14T17:03:17Z | |
dc.date.available | 2021-10-14T17:03:17Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5352 | |
dc.source | IIOimport | |
dc.title | Model for the charge trapping in high permittivity gate dielectric stacks | |
dc.type | Journal article | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Stesmans, Andre | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.source.peerreview | no | |
dc.source.beginpage | 792 | |
dc.source.endpage | 794 | |
dc.source.journal | Journal of Applied Physics | |
dc.source.issue | 1 | |
dc.source.volume | 89 | |
imec.availability | Published - imec | |