SiGeHBT for application in BiCMOS technology. I: Stability, reliability and material parameters
dc.contributor.author | Jain, Suresh | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Willander, M. | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-10-14T17:04:37Z | |
dc.date.available | 2021-10-14T17:04:37Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5362 | |
dc.source | IIOimport | |
dc.title | SiGeHBT for application in BiCMOS technology. I: Stability, reliability and material parameters | |
dc.type | Journal article | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | no | |
dc.source.beginpage | R51 | |
dc.source.endpage | R65 | |
dc.source.journal | Semiconductor Science and Technology | |
dc.source.issue | 6 | |
dc.source.volume | 16 | |
imec.availability | Published - imec |
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