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dc.contributor.authorMistele, D.
dc.contributor.authorRotter, T.
dc.contributor.authorBougrioua, Zahia
dc.contributor.authorRöver, K. S.
dc.contributor.authorFedler, F.
dc.contributor.authorKlausing, H.
dc.contributor.authorStemmer, J.
dc.contributor.authorSemchinova, O. K.
dc.contributor.authorAderhold, J.
dc.contributor.authorGraul, J.
dc.date.accessioned2021-10-14T17:21:05Z
dc.date.available2021-10-14T17:21:05Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5481
dc.sourceIIOimport
dc.titleHeterostructure field effect transistor types with novel gate dielectrics
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage255
dc.source.endpage258
dc.source.journalPhysica Status Solidi A
dc.source.issue1
dc.source.volume188
imec.availabilityPublished - imec
imec.internalnotesPaper from the 4th Int Conf on Nitride Semiconductors, 16-20 July 2001, Denver, CO, USA


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