Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle
dc.contributor.author | Ohyama, Hidenori | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Kuroda, S. | |
dc.contributor.author | Claeys, C. | |
dc.contributor.author | Takami, Y. | |
dc.contributor.author | Hakata, T. | |
dc.contributor.author | Kobayashi, K. | |
dc.contributor.author | Nakabayashi, M. | |
dc.contributor.author | Sunaga, H. | |
dc.date.accessioned | 2021-10-14T17:29:31Z | |
dc.date.available | 2021-10-14T17:29:31Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5535 | |
dc.source | IIOimport | |
dc.title | Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | no | |
dc.source.beginpage | 79 | |
dc.source.endpage | 85 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 1 | |
dc.source.volume | 41 | |
imec.availability | Published - imec |
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