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dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorKuroda, S.
dc.contributor.authorClaeys, C.
dc.contributor.authorTakami, Y.
dc.contributor.authorHakata, T.
dc.contributor.authorKobayashi, K.
dc.contributor.authorNakabayashi, M.
dc.contributor.authorSunaga, H.
dc.date.accessioned2021-10-14T17:29:31Z
dc.date.available2021-10-14T17:29:31Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5535
dc.sourceIIOimport
dc.titleDegradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage79
dc.source.endpage85
dc.source.journalMicroelectronics Reliability
dc.source.issue1
dc.source.volume41
imec.availabilityPublished - imec


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