Stress-induced leakage current (SILC) and oxide breakdown: are they from the same oxide traps?
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Cheung, K. P. | |
| dc.date.accessioned | 2021-10-14T17:34:13Z | |
| dc.date.available | 2021-10-14T17:34:13Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5565 | |
| dc.source | IIOimport | |
| dc.title | Stress-induced leakage current (SILC) and oxide breakdown: are they from the same oxide traps? | |
| dc.type | Journal article | |
| dc.source.peerreview | no | |
| dc.source.beginpage | 109 | |
| dc.source.endpage | 112 | |
| dc.source.journal | IEEE Trans. Device and Materials Reliability | |
| dc.source.issue | 2 | |
| dc.source.volume | 1 | |
| imec.availability | Published - imec |
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