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dc.contributor.authorKrishnasamy, Rajendran
dc.contributor.authorSchoenmaker, Wim
dc.date.accessioned2021-10-14T17:39:43Z
dc.date.available2021-10-14T17:39:43Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5598
dc.sourceIIOimport
dc.titleModeling of complete suppression of boron out-diffusion in Si1-xGex by carbon incorporation
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage229
dc.source.endpage233
dc.source.journalSolid-State Electronics
dc.source.volume45
imec.availabilityPublished - imec


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