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Measuring mixed-signal substrate coupling

dc.contributor.authorRolain, Y.
dc.contributor.authorVan Moer, W.
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorVan Heijningen, Marc
dc.date.accessioned2021-10-14T17:43:06Z
dc.date.available2021-10-14T17:43:06Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5618
dc.sourceIIOimport
dc.titleMeasuring mixed-signal substrate coupling
dc.typeJournal article
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.beginpage959
dc.source.endpage964
dc.source.journalIEEE Trans. Instrumentation and Measurement
dc.source.issue4
dc.source.volume50
imec.availabilityPublished - imec


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