Show simple item record

dc.contributor.authorvan Meer, Hans
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-14T18:05:33Z
dc.date.available2021-10-14T18:05:33Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5741
dc.sourceIIOimport
dc.titleA 2-D analytical threshold voltage model for fully-depleted SOI MOSFETs with halos or pockets
dc.typeJournal article
dc.contributor.imecauthorDe Meyer, Kristin
dc.source.peerreviewno
dc.source.beginpage2292
dc.source.endpage2302
dc.source.journalIEEE Trans. Electron Devices
dc.source.issue10
dc.source.volume48
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record