A 2-D analytical threshold voltage model for fully-depleted SOI MOSFETs with halos or pockets
dc.contributor.author | van Meer, Hans | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-14T18:05:33Z | |
dc.date.available | 2021-10-14T18:05:33Z | |
dc.date.issued | 2001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5741 | |
dc.source | IIOimport | |
dc.title | A 2-D analytical threshold voltage model for fully-depleted SOI MOSFETs with halos or pockets | |
dc.type | Journal article | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.source.peerreview | no | |
dc.source.beginpage | 2292 | |
dc.source.endpage | 2302 | |
dc.source.journal | IEEE Trans. Electron Devices | |
dc.source.issue | 10 | |
dc.source.volume | 48 | |
imec.availability | Published - imec |
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