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Characteristic impedance extraction using calibration comparison

dc.contributor.authorVandenberghe, S.
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorCarchon, Geert
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorDe Raedt, Walter
dc.date.accessioned2021-10-14T18:10:45Z
dc.date.available2021-10-14T18:10:45Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5769
dc.sourceIIOimport
dc.titleCharacteristic impedance extraction using calibration comparison
dc.typeJournal article
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorDe Raedt, Walter
dc.contributor.orcidimecDe Raedt, Walter::0000-0002-7117-7976
dc.source.peerreviewno
dc.source.beginpage2573
dc.source.endpage2579
dc.source.journalIEEE Trans. Microwave Theory and Techniques
dc.source.issue12
dc.source.volume49
imec.availabilityPublished - imec


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